"Lec 14 - Design for Yield / Design for Manufacturing" February 7, 2007 lecture by Fabian Klass for the Stanford University Computer Systems Colloquium (EE 380). The focus of this talk is on IC manufacturing process variability, i.e., how to design circuits for yield in the presence of manufacturing variations; also, the use of statistical methods in circuit design is presented. EE 380 | Computer Systems Colloquium: http://www.stanford.edu/class/ee380/ Stanford Computer Systems Laboratory: http://csl.stanford.edu/ Stanford Center for Professional Development: http://scpd.stanford.edu/ Stanford University Channel on YouTube: http://www.youtube.com/stanforduniversity/
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Channels: Computer Science
Tags: Lec 14 - Design for Yield / Design for Manufacturing
Uploaded by: stanfordlabcoll ( Send Message ) on 14-09-2012.
Duration: 77m 27s
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Lec 1 - Future Evolution of High-Performance Microprocessors
Lec 2 - New Architectures for a New Biology
Lec 3 - Measurements vs. Bits: Compressed Sensors and Info Theory
Lec 4 - A Structured Orchestration Language
Lec 6 - The Need, Evolution, and Detail of WLAN Security
Lec 9 - Flash Player ActionScript Virtual Machine
Lec 10 - The United Communication Transformation
Lec 11 - What the Second Generation Holds
Lec 12 - Expanding the Mobile Consumer Software Market
Lec 13 - Computer Architecture is Back: Parallel Computing Landscape
Lec 15 - Building Your Own Dynamic Language
Lec 16 - A Fast Wait-Free Hash Table
Lec 17 - An Ultrafast Optical Digital Technology Smart Light
Lec 18 - VoIP Encryption in a Surveillance Society
Lec 19 - A New Balancing Method for Solving Parametric Max Flow
Lec 20 - Nanomanufacturing Technologies
Lec 21 - Software Not Provided: Supporting Communities and Democracy
Lec 22 - New Directions in Multiprocessor Synchronization
Lec 23 - An App Developer's View of Next Gen Systems Enablement
Lec 24 - Stream Programming: Multicore Made Practical
Lec 25 - Off-the-Record Messaging: Useful Security and Privacy for IM